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Semiconductor
In semiconductor fabs, trace particles and small shifts in process gas concentration directly affect yield. This page groups instruments for cleanroom particle control, process gas analysis and specialty gas leak monitoring.
Instrument Categories
Portable Particle Counters
View allOnline (Remote) Particle Counters
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Online (Remote) Particle Counters
OPC-6510DS
28.3 LPM Online Particle Counter with Display
Parameters: >0.3 μm, >0.5 μm, >1.0 μm, >5.0 μm, >10 μm

Online (Remote) Particle Counters
OPC-6510
28.3 LPM Online Particle Counter without Display
Parameters: >0.3 μm, >0.5 μm, >1.0 μm, >5.0 μm, >10 μm

Online (Remote) Particle Counters
OPC-6303DS
2.83 LPM Online Particle Counter with Display
Parameters: >0.3 μm, >0.5 μm, >1.0 μm, >2.5 μm, >5.0 μm, >10 μm

Online (Remote) Particle Counters
OPC-6303M
2.83 LPM Online Particle Counter without Display
Parameters: >0.3 μm, >0.5 μm, >1.0 μm, >2.5 μm, >5.0 μm, >10 μm

Online (Remote) Particle Counters
OPC-8050
28.3 LPM Online Particle Counter OPC-8050
Parameters: 0.5 μm, 1.0 μm, 5.0 μm, 10 μm, 25 μm, 50 μm
Multi-Gas Analyzers
View allSemiconductor Process Gas Analyzers
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